dr Piotr Mazur

Telefon: (71) 375 9444
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E-mail: login@ifd.uni.wroc.pl


Publikacje
  • Katarzyna Lament, Miłosz Grodzicki, Piotr Mazur, Agata Sabik, Rafał Lewandków, Antoni Ciszewski ,Interactions between PTCDI-C8 and Si(100) Surface,Crystals 13 (2023) 441, 1-8
  • P. V. Galiy, T. M. Nenchuk, Antoni Ciszewski, Piotr Mazur, V. I. Dzyuba, T. R. Makar, O. V. Tsvetkova,Solid state dewetting application for in/(0001) Sb2Te3 nanosystem formation,MOLECULAR CRYSTALS AND LIQUID CRYSTALS 750 (2023) 50–59
  • Ewa Mańkowska, Michał Mazur, Jarosław Domaradzki, Piotr Mazur, Małgorzata Kot, Jan Ingo Flege,Hydrogen Gas Sensing Properties of Mixed Copper–Titanium Oxide Thin Films,Sensors 23 (2023) 3822,1-13
  • Michał Mazur, Paulina Kapuścik, Wiktoria Weichbrodt, Jarosław Domaradzki, Piotr Mazur, Małgorzata Kot, Jan Ingo Flege,WO3 Thin-Film Optical Gas Sensors Based on GasochromicEffect towards Low Hydrogen Concentrations,Materials 16 (2023) 3831,1-17
  • Ammara Ejaz, Michael McKinlay, Sam Ahmadzadeh, Manuel Pelayo Garcia, Lewis Fleming, Piotr Mazur, Michał Mazur, Des Gibson, Carlos Garcia Nuñez ,Investigation and Band Gap Analysis of Pulsed DcMagnetron Sputtered Diamond-Like Carbon to Enhance Contact-Electrification and Durability of Triboelectric Nanogenerators,Advanced Materials Technologies (2023) 2300450,1-11
  • P. V. Galiy, T. M. Nenchuk, Antoni Ciszewski, Piotr Mazur, V. I. Dzyuba, T. R. Makar, O. V. Tsvetkova,Indium deposited nanosystems formation on 2D layered chalcogenide crystals’ surfaces, MOLECULAR CRYSTALS AND LIQUID CRYSTALS (2023) 1-13
  • Miłosz Grodzicki, Jakub Sito, Rafał Lewandków, Piotr Mazur, Antoni Ciszewski ,Interfacial Polarization of Thin Alq3 , Gaq3 , and Erq3 Films on GaN(0001),Materials 15 (2022) 1671,1-10
  • Rafał Lewandków, Miłosz Grodzicki, Piotr Mazur, Antoni Ciszewski,Properties of Thin MgO Films on 6H–SiC and GaN: Photoelectron Studies,ACTA PHYSICA POLONICA A 141(2) (2022) 116-122
  • Damian Wojcieszak, A. Obstarczyk, Ewa Mańkowska, Michał Mazur, Danuta Kaczmarek, Katarzyna Zakrzewska, Piotr Mazur, Jarosław Domaradzki ,Thermal oxidation impact on the optoelectronic and hydrogen sensing properties of p-type copper oxide thin films,Materials Research Bulletin 147 (2022) 111646,1-13
  • Rafał Lewandków, Piotr Mazur, Miłosz Grodzicki,Niobium oxides films on GaN: Photoelectron spectroscopy study,THIN SOLID FILMS 763 (2022) 139573,1-5
  • P. V. Galiy, T. M. Nenchuk, Antoni Ciszewski, Piotr Mazur, V. I. Dzyuba, T. R. Makar, O. V. Tsvetkova,Solid state dewetting application for In/ (0001) Sb2Te3 2D layered semiconductor nanosystem formation,Materials Today: Proceedings 62 (2022) 5753–5758
  • Piotr Mazur, Agata Sabik, Rafał Lewandków, Artur Trembułowicz, Miłosz Grodzicki ,Obtaining Niobium Nitride on n-GaN by Surface Mediated Nitridation Technique,Crystals 12 (2022) 1847,1-7
  • Rafał Lewandków, Miłosz Grodzicki, Piotr Mazur, Antoni Ciszewski,Interface formation of Al2O3 on n-GaN(0001): Photoelectron spectroscopy studies,SURFACE AND INTERFACE ANALYSIS 53 (2021) 118-124
  • Daniel Ociński, Joanna Augustynowicz, Konrad Wołowski, Piotr Mazur, Ewa Sitek, Jerzy Raczyk,Natural community of macroalgae from chromium-contaminated site for effective remediation of Cr(VI)-containing leachates,Science of The Total Environment 786 (2021) 147501,1-11
  • Rafał Lewandków, Miłosz Grodzicki, Piotr Mazur,PHOTOELECTRON SPECTROSCOPY STUDIES ON Al2O3 FILMS ON p-GaN(0001),Surface Review and Letters 28(9) (2021) 2150077
  • Rafał Lewandków, Piotr Mazur, Artur Trembułowicz, Agata Sabik, Radosław Wasielewski, Miłosz Grodzicki,Influence of Graphite Layer on Electronic Properties of MgO/6H-SiC(0001) Interface,Materials 14 (2021) 4189, 1-9
  • Michał Mazur, Damian Wojcieszak, Artur Wiatrowski, Danuta Kaczmarek, Aneta Lubańska, Jarosław Domaradzki, Piotr Mazur, Małgorzata Kalisz,Analysis of amorphous tungsten oxide thin films deposited by magnetron sputtering for application in transparent electronics, Applied Surface Science 570 (2021) 151151, 1-12
  • P. V. Galiy, T. M. Nenchuk, Antoni Ciszewski, Piotr Mazur, V. I. Dzyuba, T. R. Makar,InTe surface application as template for indium deposited nanosystem formation, MOLECULAR CRYSTALS AND LIQUID CRYSTALS (2021)
  • P. V. Galiy, T. M. Nenchuk, Antoni Ciszewski, Piotr Mazur, O. V. Tsvetkova, V. I. Dzyuba, T. R. Makar,Solid-state Dewetting Formation of In/InTe Nanosystem,Journal Of Nano- And Electronic Physics 13(4) (2021) 04032,1-5
  • Daniel Ociński, Piotr Mazur,Highly efficient arsenic sorbent based on residual from water deironing – Sorption mechanisms and column studies,Journal of Hazardous Materials 382 (2020) 121062
  • Agata Sabik, Artur Trembułowicz, Piotr Mazur, Grażyna Antczak,STM studies of the bimolecular layer of CoPc and F16CuPc on Ag(100) with non-equal composition,SURFACE SCIENCE 693 (2020) 121534, 1-5
  • Miłosz Grodzicki, Piotr Mazur, Agata Sabik ,Impact of surface photovoltage on photoemission from Ni/p-GaN,Applied Surface Science 512 (2020) 145643, 1-5
  • R. Lewandków, Miłosz Grodzicki, Piotr Mazur, Antoni Ciszewski,Interface formation of Al2O3 on carbon enriched 6H-SiC(0001): Photoelectron spectroscopy studies,Vacuum 177 (2020) 109345, 1-5
  • Damian Wojcieszak, Małgorzata Osekowska, Danuta Kaczmarek, B. Szponar, Michał Mazur, Piotr Mazur, A. Obstarczyk,Influence of Material Composition on Structure,Surface Properties and Biological Activity of Nanocrystalline Coatings Based on Cu and Ti,Coatings — Open Access Journal 10 (2020) 10040343, 1-23
  • Irena Jacukowicz-Sobala, Daniel Ociński, Piotr Mazur, Ewa Stanisławska, Elżbieta Kociołek-Balawejder,Cu(II)-Fe(III) oxide doped anion exchangers – Multifunctional composites for arsenite removal from water via As(III) adsorption and oxidation,Journal of Hazardous Materials 394 (2020) 122527, 1-13
  • P. V. Galiy, T. M. Nenchuk, Antoni Ciszewski, Piotr Mazur, Ya. M. Buzhuk, O. V. Tsvetkova,Self‑assembled indium nanostructures formation on InSe (0001) surface,Applied Nanoscience 10 (2020)
  • Rafał Lewandków, Radosław Wasielewski, Piotr Mazur,Hafnium and Nitrogen Interaction at Hf/GaN(0001) Interface,Surface Review and Letters 27 (2020) 2050013, 1-4
  • Miłosz Grodzicki, Piotr Mazur, Jacek Brona, Antoni Ciszewski,MnGa and (Mn,Ga)N-like alloy formation during annealing of Mn/GaN(0001) interface,Applied Surface Science 481 (2019) 790–794
  • Irena Jacukowicz-Sobala, Daniel Ociński, Piotr Mazur, Ewa Stanisławska, Elżbieta Kociołek-Balawejder,Evaluation of hybrid anion exchanger containing cupric oxide for As(III) removal from water,Journal of Hazardous Materials 370 (2019) 117-125
  • P. V. Galiy, Piotr Mazur, Antoni Ciszewski, T. M. Nenchuk, I. R. Yarovets ,Scanning tunneling microscopy/spectroscopy study of In/In4Se3(100) nanosystem,European Physical Journal Plus 134 (2019) 70, 1-6
  • A. Obstarczyk, D. Kaczmarek, D. Wojcieszak, M. Mazur, J. Domaradzki, T. Kotwica, R. Pastuszek, D. Schmeisser, Piotr Mazur, M. Kot,Tailoring optical and electrical properties of thin-film coatings based on mixed Hf and Ti oxides for optoelectronic application,Materials and Design 175 (2019) 107822, 1-15
  • Miłosz Grodzicki, Piotr Mazur, Agata Sabik ,Electronic properties of p-GaN co-doped with Mn by thermal process: Surface studies,SURFACE SCIENCE 689 (2019) 121460, 1-4
  • Elżbieta Kociołek-Balawejder, Ewa Stanisławska, Irena Jacukowicz-Sobala, Piotr Mazur,Cuprite-doped macroreticular anion exchanger obtained by reduction of the Cu(OH)2 deposit,Journal of Environmental Chemical Engineering 7 (2019) 103198
  • P. V. Galiy, T. M. Nenchuk, Piotr Mazur, Antoni Ciszewski, I. R. Yarovets,Quantitative analysis of indium deposited layer formationmechanism for In/In4Se3 (100) nanosystem,MOLECULAR CRYSTALS AND LIQUID CRYSTALS 674 (2019) 11-18
  • P. V. Galiy, T. M. Nenchuk, Antoni Ciszewski, Piotr Mazur, Ya. M. Buzhuk, Z. M. Lubun, O. R. Dveriy ,Indium Deposited Nanosystem Formation on InSe (0001) Surface Applied as Template,Metallofizika i Noveishie Tekhnologii 41 (10) (2019) 1395-1405
  • M. Grodzicki, P. Mazur, A. Ciszewski,Changes of electronic properties of p-GaN(0 0 0 1) surface after lowenergy N+-ion bombardment ,Applied Surface Science 440 (2018) 547–552
  • M. Grodzicki, P. Mazur, A. Krupski, A. Ciszewski,Studies of early stages of Mn/GaN(0001) interface formation using surface-sensitive techniques ,Vacuum 153 (2018) 12-16
  • P. Mazur, J. Sito, M. Grodzicki, K. Lament, M. Crofton, A. Ciszewski ,Influence of ionic interfacial layers on electronic properties of Alq3/Si(100) interface,Surface and Interface Analysis 50 (2018) 623–627
  • Agata Sabik, Piotr Mazur, Franciszek Gołek, Artur Trembułowicz, and Grażyna Antczak ,Phthalocyanine arrangements on Ag(100): From pure overlayers of CoPc and F16CuPc to bimolecular heterostructure ,Journal of Chemical Physics 149 (2018) 144702
  • P. V. Galiy, P. Mazur, A. Ciszewski, T. M. Nenchuk, I. R. Yarovets, O. R. Dveriy, Structural Aspect of Formation of a Nanosystem of In/In4Se3 (100) , Metallofiz. Noveishie Tekhnol. 40 No 10 (2018) 1349–1358
  • P.V. Galiy, T.M. Nenchuk, O.R. Dveriy A. Ciszewski, P. Mazur,Study of Self-assembled 2D Ag Nanostructures Intercalated into In4Se3Layered Semiconductor ,Proceedings of the 2018 IEEE 8th International Conference on Nanomaterials: Applications & Properties (NAP-2018) (2018) 02CBM02-1 02CBM
  • P.V. Galiy, V.I. Vasil'tsiv, A.P. Luchechko, P. Mazur, T.M. Nenchuk, O.V. Tsvetkova, R. Yarovets,Elemental-phase and Structural Investigations of the Polycrystalline Surfaces of β-Ga2O3- SnO2 System Compounds ,Journal of Nano- and Electronic Physics 10 No 5 (2018) 05039
  • P. V. Galiy, T. M. Nenchuk, A. Ciszewski, P. Mazur, I. R. Yarovets', O. R. Dveriy,NixInSe (0001) Metal—Semiconductor Hetero Nano System Study,Metallofiz. Noveishie Tekhnol. 39 (7) (2017) 995—1004
  • Michal Mazur, Torsten Howind, Des Gibson, Danuta Kaczmarek, Jerzy Morgiel, Damian Wojcieszak, Wenzhong Zhu, Piotr Mazur,Modification of various properties of HfO2 thin films obtained by changing magnetron sputtering conditions,Surface & Coatings Technology 320 (2017) 426–431
  • M. Grodzicki, P. Mazur, A. Ciszewski,Modification of electronic structure of n-GaN(0001) surface by N+-ion bombardment.,Acta Physica Polonica A 132(2) (2017) 351-353
  • J. Sito, M. Grodzicki, K. Lament, R. Wasielewski, P. Mazur, A. Ciszewski,Electronic Properties of Structures Containing Films of Alq3 and LiBr Deposited on Si(111) Crystal,Acta Physica Polonica A 132(2) (2017) 357-359
  • Miłosz Grodzicki, Piotr Mazur, Radosław Wasielewski, Antoni Ciszewski,Physicochemical properties of the Sb/p-SiC interface,Vacuum 146 (2017) 216-220
  • R. Wasielewski, M. Grodzicki, J. Sito, K. Lament, P. Mazur, A. Ciszewski ,Ru/GaN(0001) Interface Properties,Acta Physica Polonica A 132(2) (2017) 354-356
  • Daniel Ociński, Irena Jacukowicz-Sobala, Piotr Mazur, Jerzy Raczyk, Elżzbieta Kociołek-Balawejder,Water treatment residuals containing iron and manganese oxides for arsenic removal from water – Characterization of physicochemical properties and adsorption studies,Chemical Engineering Journal 294 (2016) 210–221
  • K. Idczak, P. Mazur, S. Zuber, L. Markowski,An investigation of thin Zr films on 6H-SiC(0001) and GaN(0001) surfaces by XPS, LEED, and STM,Applied Physics A 122 (2016) 268
  • P.V. Galiy, P. Mazur, A. Ciszewski, I.R Yarovets, T.M. Nenchuk, Frank Simon, Ya.M. Buzhuk, V.L. Fomenko,The Study of Surfaces' Micro- and Nanostructure on Interlayer Cleavages of InSe Layered Crystals Intercalated by Nickel,Journal Of Nano- And Electronic Physics 8(1) (2016) 01012
  • M. Mazur, M. Kalisz, D. Wojcieszak, M. Grobelny, P. Mazur, D. Kaczmarek, J. Domaradzki,Determination of structural, mechanical and corrosion properties of Nb2O5 and (NbyCu1−y)Ox thin films deposited on Ti6Al4V alloy substrates for dental implant applications,Materials Science and Engineering C 47 (2015) 211-221
  • Radosław Wasielewski, Piotr Mazur, Miłosz Grodzicki, Antoni Ciszewski,TiO thin films on GaN(0001),Physica Status Solidi B 252(5) (2015) 1001-1005
  • P. Galiy, T. Nenchuk, A. Ciszewski, P. Mazur, S. Zuber, I. Yarovets,Scanning Tunnelling Microscopy/Spectroscopy and Low-Energy Electron Diffraction Investigations of GaTe Layered Crystal Cleavage Surface,Metallofizika I Noveishie Tekhnologii 37(6) (2015) 789—801
  • Michal Mazur, Torsten Howind, Des Gibson, Danuta Kaczmarek, Shigeng Song, Damian Wojcieszak, Wenzhong Zhu, Piotr Mazur, Jaroslaw Domaradzki, Frank Placido,Investigation of structural, optical and micro-mechanical properties of (NdyTi1 − y)Ox thin films deposited by magnetron sputtering,Materials and Design 85 (2015) 377–388
  • M. Grodzicki, P. Mazur, J. Pers, J. Brona, S. Zuber, A. Ciszewski,Formation of GaPd2 and GaPd intermetallic compounds on GaN(0001),Applied Physics A 120 (2015) 1443–1451
  • M. Kurnatowska, W. Mista, P. Mazur, L. Kępiński,Nanocrystalline Ce1−xRuxO2– Microstructure, stability and activity in CO and soot oxidation,Applied Catalysis B: Environmental 148-149 (2014) 123-135
  • M. Grodzicki, P. Mazur, S. Zuber, J. Brona, A. Ciszewski,Oxidation of GaN(0001) by low-energy ion bombardment.,Applied Surface Science 304 (2014) 20–23
  • M. Grodzicki, P. Mazur, S. Zuber, J. Pers, J. Brona, A. Ciszewski,Effect of annealing on Ni/GaN(0 0 0 1) contact morphology,Applied Surface Science 304 (2014) 24-28
  • Katarzyna Lament, Wojciech Kamiński, Piotr Mazur, Stefan Zuber, Antoni Ciszewski,Molecular recognition of PTCDI–C8 molecules on the Si(1 1 0)–(16 × 2) surface,Applied Surface Science 304 (2014) 50–55
  • M. Mazur, J. Domaradzki, D. Wojcieszak, D. Kaczmarek, P. Mazur,Investigation of physicochemical properties of (Ti-V)Ox (4.3 at.% of V) functional thin films and their possible application in the field of transparent electronics,Applied Surface Science 304 (2014) 73-80
  • K. Idczak, P. Mazur, S. Zuber, L. Markowski, M. Skiścim, S. Bilińska,Growth of thin zirconium and zirconium oxides films on the n-GaN(0 0 0 1) surface studied by XPS and LEED.,Applied Surface Science 304 (2014) 29-34
  • M. Grodzicki, P. Mazur, S. Zuber, J. Pers, A. Ciszewski,Pd/GaN(0001) interface properties,Materials Science-Poland 32(2) (2014) 252-256
  • F. Gołek, P. Mazur, Z. Ryszka, S. Zuber,AFM image artifacts,Applied Surface Science 304 (2014) 11–19
  • P. Mazur, S. Zuber, M. Grodzicki, A. Ciszewski,AFM/STM Modification of Thin Sb Films on 6H-SiC(0001),Acta Physica Polonica A 126 (2014) 1131
  • M. Grodzicki, P. Mazur, J. Pers, S. Zuber, A. Ciszewski,Sb Layers on p-GaN:UPS, XPS and LEED Study, Acta Physica Polonica A 126 (2014) 1128
  • Miłosz Grodzicki, Radosław Wasielewski, Piotr Mazur, Stefan Zuber, Antoni Ciszewski ,TiO2 thin films grown on SiO2-Si(111) by the reactive evaporation method ,Optica Applicata Vol. XLIII,No.1 (2013) 99-107.
  • Miłosz Grodzicki, Piotr Mazur, Radosław Wasielewski, Antoni Ciszewski,Formation of Cr ohmic contact on graphitized 6H-SiC(0001) surface ,Optica Applicata Vol.XLIII, No.1 (2013) 91-98.
  • P.V. Galiy, T.M. Nenchuk, A. Ciszewski, P. Mazur, S. Zuber, Ya.M. Buzhuk, Indium induced nanostructures on In4Se3 (100) surface studied by scanning tunneling microscopy ,Functional Materials 20, No.1 (2013) 37-43.
  • Michał Mazur, Danuta Kaczmarek, Jarosław Domaradzki, Damian Wojcieszak, Piotr Mazur, Eugeniusz Prociow,Structural and surface properties of TiO2 thin films doped with neodymium deposited by reactive magnetron sputtering ,Materials Science-Poland 31(1) (2013) pp. 71-79.
  • P. V. Galiy, T. M. Nenchuk, A. Ciszewski, P. Mazur, Ya. M. Buzhuk, I. R. Yarovets,Nanostructural Studies of (100) Surfaces of In4Se3 Crystals Intercalated by Silver ,Metallofizika i Noveishie Tekhnologii, Vol. 35, No. 8 (2013) 1031-1o43.
  • K. Lament, P. Mazur, S. Zuber, A. Ciszewski,PTCDI-C8 Adsorption on Si(100),Acta Physica Polonica A 124 (2013) 775-776
  • R. Dylewicz, A.Z. Khokhar, R. Wasielewski, P. Mazur, F. Rahman, Nanostructured graded-index antireflection layer formation on GaN for enhancing light extraction from light-emitting diodes,Appl Phys B 107: (2012) 393-399.
  • Rafal Dylewicz, Ali Z Khokhar, Radosław Wasielewski, Piotr Mazur, Faiz Rahman,Nanotexturing of GaN light-emitting diode material through mask-less dry etching,Nanotechnology 22 (2011) 055301 (7pp).
  • P.V. Galiy, T.M. Nenchuk, O.R. Dveriy, A. Ciszewski, P. Mazur, S. Zuber, Ya.M. Buzhuk,Scanning tunneling spectroscopy of In4Se3 layered semiconductor crystals,Chem. Met. Alloys 4 (2011) 1-5.
  • Piotr Mazur, Leszek Markowski, Miłosz Grodzicki,Thermal stability of LiF thin films on 6H-SiC(0001) surface,Vacuum 84 (2010) 622-624.
  • Tomasz Greczyło, Piotr Mazur, Ewa Dębowska, Piotr Wieczorek, Determination of mass sensitivity of crystal quartz resonators at students' laboratory , Eur. J. Phys. 31 (2010) 257-265.
  • R. Dylewicz, R. M. De La Rue, R. Wasielewski, P. Mazur, G. Mezősi, A. C. Bryce, Fabrication of submicron-sized features in InP/InGaAsP/AlGalnAs quantum well heterostructures by optimized inductively coupled plasma etching with Cl2/Ar/N2 chemistry , J. Vac. Sci. Technol. B 28(4) (2010) 882-890.
  • Piotr Mazur, Leszek Markowski, Oxygen Influence on the Growth of Thin Hf Films on the 6H-SiC(0001) Surfaces , Surf. Interface Anal. 42 (2010) 1561 -1565.
  • Miłosz Grodzicki, Szymon Smolarek, Piotr Mazur, Stefan Zuber, Antoni Ciszewski,Characterization of Cr/6H-SiC(0 0 0 1) nano-contacts by current-sensing AFM,Applied Surface Science 256 (2009) 1014-1018.
  • P. Mazur, L. Markowski, M. Kamiński, L. Boczek,The Growth of thin Hf films on 6H-SiC(0001) surface,JSPS 141 Committee Activity Report, Proceedings of the 7th International Symposium on Atomic Level Characterization for New Materials and Devices '09, Maui, USA (2009) 543-547.
  • P.V. Galiy, T.M. Nenchuk, O.R. Dveriy, A. Ciszewski, P. Mazur, S. Zuber,Atomic force microscopy study of the cleavage surfaces of In4Se3 layered semiconductor crystal, Physica,Physica E 41 (2009) 465-469.
  • Tomasz Greczyło, Piotr Mazur, Ewa Dębowska,Auger electron spectroscopy for the advanced student laboratory,Eur. J. Phys. 30 (2009) 311-323.
  • P. Mazur, S. Zuber,STM and AFM study of NaCl layers on Si(100) surface,VISNYK LVIV UNIV. Ser. Physics. IS. 43 (2009) 249-254.
  • Miłosz Grodzicki, Jan Chrzanowski, Piotr Mazur, Stefan Zuber, Antoni Ciszewski,Cr ohmic contact on an Ar+ ion modified 6H-SiC(0001) surface,Optica Applicata, VOL. XXXIX NO 4 (2009) 765-772.
  • P. Galiy, T. Nenchuk, O. Dveriy, A. Ciszewski, P. Mazur, S. Zuber,Nanoscale STM/STS/AFM studies of (100) In4Se3 crystal surfaces ,VISNYK LVIV UNIV. Ser. Physics. 2009. Is. 43. (2009) 28-35.
  • P.V. Galiy, A. Ciszewski, O.R. Dveriy, Ya.B. Losovyj, P. Mazur, T.M. Nenchuk, S. Zuber, Ya. M. Fiyala, Investigation of (100) In4Se3 crystal surface nanorelief,Functional Materials 16, No.3 (2009) 279-285.
  • Miłosz Grodzicki, Radosław Wasielewski, Piotr Mazur, Stefan Zuber, Antoni Ciszewski,Preparation of TiO2 thin films by reactive evaporation method ,2009 International Students and Young Scientists Workshop "Photonics and Microsystems", Harz University, Wernigerode, Germany, 25-27 June, (2009) 25-27.
  • Miłosz Grodzicki, Radosław Wasielewski, Piotr Mazur, Antoni Ciszewski,Preparation technique of 6H-SiC(0001) wafers,2009 International Students and Young Scientists Workshop "Photonics and Microsystems", Harz University, Wernigerode, Germany, 25-27 June (2009) 28-30.
  • Tomasz Greczyło, Piotr Mazur, Ewa Dębowska, Piotr Wieczorek,Wyznaczanie czułości masowej rezonatora kwarcowego w zaawansowanej pracowni fizycznej,Aparatura badawcza i dydaktyczna Tom XIV Nr 3 (2009) 61-68.
  • P. Mazur, S. Zuber, M. Grodzicki, A. Ciszewski,Morphology and electric conductance of ultra-thin Cr contacts on 6H-SiC(0001): AFM and current-sensing AFM study,Vacuum 82 (2008) 364-371.
  • P. Mazur, M. Grodzicki, S. Zuber, A. Ciszewski,Current patterning of 6H–SiC(0001) surface by AFM ,Applied Surface Science Vol 254 (2008) 4332-4335.
  • P. Mazur, S. Zuber, M. Grodzicki, A. Ciszewski,Effects of Ar+ ion sputtering on morphology and electric conductance of 6H-SiC (0001) surface,Materials Science-Poland No. 2 (2008) 265-269.
  • P. Mazur, S. Zuber,Effects of thermal treatment on the morphology of Alq3 thin layers on Si(1 1 1) substrate,Applied Surface Science 254 (2008) 4336-4339.
  • F. Gołek, P. Mazur, Z. Ryszka, S. Zuber,Morphology of alkali halide thin films,Applied Surface Science 254 (2008) 4292-4296.
  • Miłosz Grodzicki , Piotr Mazur, Stefan Zuber, Grzegorz Urbanik, Antoni Ciszewski,Empty core screw dislocations formed on 6H-SiC(0001) during hydrogen etching,Thin Solid Films 516 (2008) 7530-7537.
  • Piotr Mazur, Stefan Zuber, Miłosz Grodzicki, Antoni Ciszewski,Basic Problems in Electrical Contact Formation on 6H-SiC(0001),International Conference Microtechnology and Thermal Problems in Electronics, MicroTherm'2007,25.06.-27.06. (2007) 243-246.
  • F. Golek, P. Mazur, Z. Ryszka, S. Zuber,Morphology of alkali halide min films studied by AFM,Surface Science 600 (2006) 1689-1696.
  • T. Greczylo, P. Mazur, E. Dębowska,A field emission microscope in an advanced students' laboratory,Eur. J. Phys. 27 (2006) 265-272.
  • P. Mazur and F. Gołek,Morphology of LiBr/LiF system studied by C-AFM,Physica Status Solidi (a) 202, 14 (2005) R155-R157.
  • P. Mazur, S. Zuber, A. Ciszewski,Tribology in nano- and mesoscale - atomic force microscopy study,Tribology Science and Application, Vienna (2004) 209.
  • F. Gołek, P. Mazur,LiF thin layers on Si(100) studied by ESD, LEED, AES and AFM,Surface Science 541 (2003) 173.
  • P. Mazur,Photoemission spectroscopy of CuCl/LiBr interface,Vacuum 63 (2001) 345.
  • T. Lewowski, P. Mazur, P. Wieczorek,Double electric layer at the LiBr/NaCl interface,Vacuum 48 (1997) 305